Development of a measurement base for static secondary ion mass spectrometry
This work sets out a framework to provide a metrological basis for static SIMS measurements. This surface analytical technique has been is use for over thirty years but, because of the lack of an infrastructure, has not achieved its full potential in industry. To build this basis, the measurement ch...
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| Format: | Default Thesis |
| Published: |
2000
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| Subjects: | |
| Online Access: | https://hdl.handle.net/2134/11110 |
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