The growth, structure and electrical properties of PVD deposited thin films and nanostructures of bismuth and antimony
The electrical and structural properties of thin film bismuth deposited under various growth conditions, onto substrates of glass, silicon and gallium arsenide have been investigated. These have been analysed by four point probe measurements, X-ray diffraction and by direct SEM and FIB imaging. The...
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| Format: | Default Thesis |
| Published: |
2009
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| Online Access: | https://hdl.handle.net/2134/10500 |
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