A big data MapReduce framework for fault diagnosis in cloud-based manufacturing

This research develops a MapReduce framework for automatic pattern recognition based on fault diagnosis by solving data imbalance problem in a cloud-based manufacturing (CBM). Fault diagnosis in a CBM system significantly contributes to reduce the product testing cost and enhances manufacturing qual...

Full description

Bibliographic Details

Main Authors:	Ajay Kumar, Ravi Shankar, Alok Choudhary, Lakshman S. Thakur
Format:	Default Article
Published:	2016
Subjects:	Other commerce, management, tourism and services not elsewhere classified Big data analytics Class imbalance problem Radial basis function Support vector machine (SVM) Fault diagnosis and cloud-based manufacturing Business and Management not elsewhere classified
Online Access:	https://hdl.handle.net/2134/23087
Tags:	Add Tag No Tags, Be the first to tag this record!