Extraction of displacement data from Electronic Speckle Pattern Interferometric fringe patterns using digital image processing techniques

The commercial exploitation of Electronic Speckle Pattern Interferometry (ESPI) is now gathering pace with manufacturers marketing products in Europe and the USA. The power of the technique both in a research and an industrial inspection role has brought pressure from the engineering community for a...

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Bibliographic Details

Main Author:	David Kerr
Format:	Default Thesis
Published:	1992
Subjects:	Mechanical engineering not elsewhere classified untagged Mechanical Engineering not elsewhere classified
Online Access:	https://hdl.handle.net/2134/28205
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