Electrical overstress failure in GaAs MESFET structures
An experimental and theoretical analysis has been carried out into the effects of electrostatic discharge and constant power electrical overstress in GaAs MES structures. An experimental system has been set up to measure the electrical and physical characteristics of such devices when subject to ele...
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| Format: | Default Thesis |
| Published: |
1990
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| Subjects: | |
| Online Access: | https://hdl.handle.net/2134/11006 |
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