Automated characterisation of multi-junction thin film silicon solar cells

Accurate measurements and calibration of amorphous silicon and micromorph multi-junction solar cells poses a major challenge. Device measurements with commonly used single-lamp solar simulators can be associated with large uncertainties, as small changes in the simulator light can lead to significan...

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Bibliographic Details

Main Authors:	Martin Bliss, Christopher J. Hibberd, Yingning Qiu, Tom Betts, Ralph Gottschalg
Format:	Default Conference proceeding
Published:	2009
Subjects:	Mechanical engineering not elsewhere classified Multijunction Solar Cell MJ Automated Characterisation Measurement Mechanical Engineering not elsewhere classified
Online Access:	https://hdl.handle.net/2134/5388
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