An analysis of the weakest-link model for early electromigration failure
The application of the weakest-link or failure-unit model to electromigration failure is discussed in relation to a simple model that should describe the early failures in fine-line, as-patterned aluminium reasonably well. The earliest failures are expected to be due to the presence of at least one...
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| Format: | Default Article |
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2004
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| Online Access: | https://hdl.handle.net/2134/9046 |
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