Electrical mismatch within single junction amorphous silicon and micromorph tandem thin film PV modules

Due to the electrical mismatch between the individual cells, the actual efficiency of a PV module is always lower than the sum of the cells under normal measurement conditions. The effect of this electrical mismatch is simulated for single junction amorphous silicon PV modules as well as micromorph...

Full description

Saved in:
Bibliographic Details
Main Authors: Yingning Qiu, Tom Betts, Ralph Gottschalg
Format: Default Conference proceeding
Published: 2009
Subjects:
Online Access:https://hdl.handle.net/2134/8199
Tags: Add Tag
No Tags, Be the first to tag this record!