Large area LBIC measurement system for thin film photovoltaic modules

A laser beam induced current system has been developed for large area thin film technology. Employing a non-destructive laser scanning approach, such a system is used as a characterisation tool that is able to perform local performance investigation and allows efficient defect detection in large sca...

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Bibliographic Details
Main Authors: Pongpan Vorasayan, Martin Bliss, Thomas R. Betts, Ralph Gottschalg, A.N. Tiwari
Format: Default Conference proceeding
Published: 2006
Subjects:
LBIC
Module
Characterisation
a-Si
Online Access:https://hdl.handle.net/2134/5126
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https://hdl.handle.net/2134/5126

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