Large area LBIC measurement system for thin film photovoltaic modules
A laser beam induced current system has been developed for large area thin film technology. Employing a non-destructive laser scanning approach, such a system is used as a characterisation tool that is able to perform local performance investigation and allows efficient defect detection in large sca...
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| Main Authors: | , , , , |
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| Format: | Default Conference proceeding |
| Published: |
2006
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| Subjects: | |
| Online Access: | https://hdl.handle.net/2134/5126 |
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