Structural analysis of thin film silicon PV modules by means of large area laser beam induced current measurements

The spatial variation of key properties of large area silicon thin film PV modules is investigated using a Laser Beam Induced Current (LBIC) system. The system produces a very detailed current mapping of devices, allowing the identification of spatially varying structural defects of photovoltaic mod...

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Bibliographic Details

Main Authors:	Pongpan Vorasayan, Tom Betts, Ralph Gottschalg, A.N. Tiwari
Format:	Default Conference proceeding
Published:	2006
Subjects:	LBIC a-Si Module
Online Access:	https://hdl.handle.net/2134/5168
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