In-situ fiber-based surface profile measurement system using low coherence interferometer

For many high-value manufacturing applications, advanced control systems are required to ensure product quality is maintained; this requires accurate data to be collected from in-situ sensors. Making accurate in-situ measurements is challenging due to the aggressive environments found within manufac...

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Bibliographic Details
Main Authors: Ranveer S. Matharu, T. Hovell, Jon Petzing, Shreedhar Rangappa, Laura Justham, Peter Kinnell
Format: Default Conference proceeding
Published: 2018
Subjects:
Online Access:https://hdl.handle.net/2134/36637
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