Accelerated testing of performance of thin film module
There is an interest in identifying localised effects when investigating durability of devices. The combination of tests might also have an influence on test results. This is investigated for single junction amorphous silicon modules. The modules were put under accelerated testing including thermal...
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| Main Authors: | , , , |
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| Format: | Default Conference proceeding |
| Published: |
2008
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| Subjects: | |
| Online Access: | https://hdl.handle.net/2134/5124 |
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