Measurement of all orthogonal components of displacement in the volume of scattering materials using wavelength scanning interferometry
A wavelength scanning interferometry system is proposed that provides displacement fields inside the volume of semitransparent scattering materials with high spatial resolution and three-dimensional (3D) displacement sensitivity. This effectively extends digital speckle pattern interferometry into t...
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| Main Authors: | , |
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| Format: | Default Article |
| Published: |
2012
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| Subjects: | |
| Online Access: | https://hdl.handle.net/2134/13320 |
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