Analysis of multistate models for electromigration failure

The application of a multistate Markov chain is considered as a model of electromigration interconnect degradation and eventual failure. Such a model has already been used [ Tan et al., J. Appl. Phys. 102, 103703 (2007) ], maintaining that, in general, it leads to a failure distribution described by...

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Bibliographic Details
Main Author: Vincent Dwyer
Format: Default Article
Published: 2010
Subjects:
Mechanical engineering not elsewhere classified
Belief networks
Electromigration
Failure analysis
Integrated circuit interconnections
Markov processes
Voids (solid)
Mechanical Engineering not elsewhere classified
Online Access:https://hdl.handle.net/2134/9486
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