Analysis of coherent symmetrical illumination for electronic speckle pattern shearing interferometry
In an effort to find a non-contact technique capable of providing measurements of in-plane strain, the authors designed a speckle shearing interferometer using symmetrical coherent illumination. It is presented the analysis of the sensitivity to displacement and strain of this interferometer, togeth...
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| Main Authors: | , , , |
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| Format: | Default Article |
| Published: |
2005
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| Subjects: | |
| Online Access: | https://hdl.handle.net/2134/3638 |
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