Electromigration voiding in nanoindented, single crystal Al lines
We consider the interpretation of some theoretical and experimental work regarding electromigration voiding in nanoindented, single crystal aluminum lines. A recently suggested voiding criterion of a critical accumulated flux divergence is found, in fact, to be identical to the widely accepted criti...
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| Main Authors: | , |
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| Format: | Default Article |
| Published: |
2001
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| Subjects: | |
| Online Access: | https://hdl.handle.net/2134/4985 |
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