Electroluminescence imaging of PV devices: Advanced vignetting calibration

IEEE Electroluminescence (EL) imaging is affected by off-axis illumination together with sensor and lens imperfections. The images’ spatial intensity distribution is mainly determined by the vignetting effect. For quantitative EL imaging, its correction is essential. If neglected, intensities can va...

Full description

Bibliographic Details

Main Authors:	Karl G. Bedrich, Matevz Bokalic, Martin Bliss, Marko Topic, Tom Betts, Ralph Gottschalg
Format:	Default Article
Published:	2018
Subjects:	Mechanical engineering not elsewhere classified Foundations of quantum mechanics Calibration Electroluminescence (EL) Flat field Photovoltaic (PV) cells Photovoltaic modules Vignetting Mechanical Engineering not elsewhere classified Quantum Mechanics
Online Access:	https://hdl.handle.net/2134/34672
Tags:	Add Tag No Tags, Be the first to tag this record!