Analysis of critical-length data from electromigration failure studies
An accurate estimation of the Blech length, the critical line length below which interconnect lines are immortal, is vital as it allows EDA tools to reduce their workload. In lines longer than the Blech length, either a void will inevitably nucleate and grow until the line fails, or the line will ru...
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| Format: | Default Article |
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2011
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| Online Access: | https://hdl.handle.net/2134/8822 |
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