Cross-characterization for imaging parasitic resistive losses in thin-film photovoltaic modules

Thin-film photovoltaic (PV) modules often suffer from a variety of parasitic resistive losses in transparent conductive oxide (TCO) and absorber layers that significantly affect the module electrical performance. This paper presents the holistic investigation of resistive effects due to TCO lateral...

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Bibliographic Details
Main Authors: Archana Sinha, Martin Bliss, Xiaofeng Wu, Subinoy Roy, Ralph Gottschalg, Rajesh Gupta
Format: Default Article
Published: 2016
Subjects:
Mechanical engineering not elsewhere classified
Imaging
Spatially-resolved
Electroluminescence
Lock-in thermography
Light beam induced current
Characterization
Transparent conductive oxide
Thin-film
Photovoltaic module
Mechanical Engineering not elsewhere classified
Online Access:https://hdl.handle.net/2134/22537
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